Issued Patents All Time
Showing 51–75 of 173 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9922988 | Embedded SONOS based memory cells | Igor G. Kouznetsov, Venkatraman Prabhakar | 2018-03-20 |
| 9911747 | Integration of a memory transistor into high-k, metal gate CMOS process flow | — | 2018-03-06 |
| 9911746 | Integration of a memory transistor into high-k, metal gate CMOS process flow | — | 2018-03-06 |
| 9911613 | Method of fabricating a charge-trapping gate stack using a CMOS process flow | Hui-Mei Shih | 2018-03-06 |
| 9893172 | Methods to integrate SONOS into CMOS flow | Venkatraman Prabhakar | 2018-02-13 |
| 9824895 | Method of integration of ONO stack formation into thick gate oxide CMOS flow | — | 2017-11-21 |
| 9793284 | Method of ONO stack formation | — | 2017-10-17 |
| 9793125 | SONOS stack with split nitride memory layer | Fredrick B. Jenne | 2017-10-17 |
| 9741803 | Nonvolatile charge trap memory device having a deuterated layer in a multi-layer charge-trapping region | Sagy Levy, Fredrick B. Jenne | 2017-08-22 |
| 9721962 | Integration of a memory transistor into high-k, metal gate CMOS process flow | — | 2017-08-01 |
| 9716153 | Nonvolatile charge trap memory device having a deuterated layer in a multi-layer charge-trapping region | Sagy Levy, Fredrick B. Jenne | 2017-07-25 |
| 9620516 | Embedded SONOS based memory cells | Igor G. Kouznetsov, Venkatraman Prabhakar | 2017-04-11 |
| 9548348 | Methods of fabricating an F-RAM | Shan Sun, Thomas E. Davenport, Kedar Patel | 2017-01-17 |
| 9502543 | Method of manufacturing for memory transistor with multiple charge storing layers and a high work function gate electrode | Igor Polishchuk, Sagy Levy | 2016-11-22 |
| 9496144 | Method of fabricating a charge-trapping gate stack using a CMOS process flow | Hui-Mei Shih | 2016-11-15 |
| 9460974 | Oxide formation in a plasma process | Jeong Soo Byun | 2016-10-04 |
| 9449831 | Oxide-nitride-oxide stack having multiple oxynitride layers | Sagy Levy, Fredrick B. Jenne, Sam Geha | 2016-09-20 |
| 9431549 | Nonvolatile charge trap memory device having a high dielectric constant blocking region | Igor Polishchuk, Sagy Levy | 2016-08-30 |
| 9406574 | Oxide formation in a plasma process | Jeong Soo Byun | 2016-08-02 |
| 9356035 | Embedded SONOS based memory cells | Igor G. Kouznetsov, Venkatraman Prabhakar | 2016-05-31 |
| 9355849 | Oxide-nitride-oxide stack having multiple oxynitride layers | Sagy Levy, Fredrick B. Jenne, Sam Geha | 2016-05-31 |
| 9355725 | Non-volatile memory and method of operating the same | Bo Jin, Xiaojun Yu, Igor G. Kouznetsov, Venkatraman Prabhakar | 2016-05-31 |
| 9349877 | Nitridation oxidation of tunneling layer for improved SONOS speed and retention | Sagy Levy, Frederick B. Jenne | 2016-05-24 |
| 9349824 | Oxide-nitride-oxide stack having multiple oxynitride layers | Sagy Levy, Frederick B. Jenne, Sam Geha | 2016-05-24 |
| 9306025 | Memory transistor with multiple charge storing layers and a high work function gate electrode | Igor Polishchuk, Sagy Levy | 2016-04-05 |