KR

Krishnaswamy Ramkumar

Cypress Semiconductor: 139 patents #2 of 1,852Top 1%
LS Longitude Flash Memory Solutions: 27 patents #1 of 26Top 4%
Infineon Technologies Ag: 6 patents #1,452 of 7,486Top 20%
📍 San Jose, CA: #71 of 32,062 inventorsTop 1%
🗺 California: #750 of 386,348 inventorsTop 1%
Overall (All Time): #4,613 of 4,157,543Top 1%
173
Patents All Time

Issued Patents All Time

Showing 76–100 of 173 patents

Patent #TitleCo-InventorsDate
9299568 SONOS ONO stack scaling Fredrick B. Jenne, Sagy Levy 2016-03-29
9218978 Method of ONO stack formation 2015-12-22
9196496 Method of integrating a charge-trapping gate stack into a CMOS flow 2015-11-24
9105512 SONOS stack with split nitride memory layer Fredrick B. Jenne 2015-08-11
9102522 Method of ONO integration into logic CMOS flow Bo Jin, Fredrick B. Jenne 2015-08-11
9093318 Memory transistor with multiple charge storing layers and a high work function gate electrode Igor Polishchuk, Sagy Levy 2015-07-28
9023707 Simultaneously forming a dielectric layer in MOS and ONO device regions Bo Jin, Fredrick B. Jenne 2015-05-05
9018693 Deuterated film encapsulation of nonvolatile charge trap memory device Fredrick B. Jenne, William Koutny 2015-04-28
8993457 Method of fabricating a charge-trapping gate stack using a CMOS process flow Hui-Mei Shih 2015-03-31
8993453 Method of fabricating a nonvolatile charge trap memory device Jeong Soo Byun, Sagy Levy 2015-03-31
8993400 Deuterated film encapsulation of nonvolatile charge trap memory device Fredrick B. Jenne, William C. Koutny 2015-03-31
8940645 Radical oxidation process for fabricating a nonvolatile charge trap memory device Sagy Levy, Jeong Soo Byun 2015-01-27
8916432 Methods to integrate SONOS into CMOS flow Venkatraman Prabhakar 2014-12-23
8883624 Integration of a memory transistor into high-K, metal gate CMOS process flow 2014-11-11
8871595 Integration of non-volatile charge trap memory devices and logic CMOS devices Fredrick B. Jenne, Sagy Levy 2014-10-28
8859374 Memory transistor with multiple charge storing layers and a high work function gate electrode Igor Polishchuk, Sagy Levy 2014-10-14
8822349 Oxide formation in a plasma process Jeong Soo Byun 2014-09-02
8796098 Embedded SONOS based memory cells Igor G. Kouznetsov, Venkatraman Prabhakar 2014-08-05
8772059 Inline method to monitor ONO stack quality Yu-Hsiang Yang 2014-07-08
8710578 SONOS stack with split nitride memory layer Fredrick B. Jenne 2014-04-29
8710579 SONOS stack with split nitride memory layer Fredrick B. Jenne 2014-04-29
8691648 Methods for fabricating semiconductor memory with process induced strain Igor Polishchuk, Sagy Levy, Jeong Soo Byun 2014-04-08
8685813 Method of integrating a charge-trapping gate stack into a CMOS flow 2014-04-01
8679927 Integration of non-volatile charge trap memory devices and logic CMOS devices Fredrick B. Jenne, Sagy Levy 2014-03-25
8680601 Nonvolatile charge trap memory device having a deuterated layer in a multi-layer charge-trapping region Sagy Levy, Fredrick B. Jenne 2014-03-25