Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11977097 | Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscope | Gabriel Baralia, Rainer Becker, Christof Baur, Hans Hermann Pieper | 2024-05-07 |
| 11680963 | Method and apparatus for examining a measuring tip of a scanning probe microscope | Christof Baur, Markus Bauer | 2023-06-20 |
| 11353478 | Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscope | Gabriel Baralia, Rainer Becker, Christof Baur, Hans Hermann Pieper | 2022-06-07 |
| 11237187 | Method and apparatus for examining a measuring tip of a scanning probe microscope | Christof Baur, Markus Bauer | 2022-02-01 |
| 10732501 | Method and device for permanently repairing defects of absent material of a photolithographic mask | Jens Oster, Tristan Bret, Horst Schneider, Thorsten Hofmann | 2020-08-04 |
| 10372032 | Method and device for permanently repairing defects of absent material of a photolithographic mask | Jens Oster, Tristan Bret, Horst Schneider, Thorsten Hofmann | 2019-08-06 |