Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11977097 | Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscope | Gabriel Baralia, Rainer Becker, Kinga Kornilov, Christof Baur | 2024-05-07 |
| 11899359 | Method and apparatus for removing a particle from a photolithographic mask | Christof Baur | 2024-02-13 |
| 11429020 | Method and apparatus for removing a particle from a photolithographic mask | Christof Baur | 2022-08-30 |
| 11353478 | Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscope | Gabriel Baralia, Rainer Becker, Kinga Kornilov, Christof Baur | 2022-06-07 |
| 9995764 | Method and apparatus for avoiding damage when analysing a sample surface with a scanning probe microscope | Christof Baur, Rainer Fettig | 2018-06-12 |