Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11961705 | Method and apparatus for examining a beam of charged particles | Daniel Rhinow, Markus Bauer, David Lämmle, Marion Batz, Katharina Gries +3 more | 2024-04-16 |
| 9995764 | Method and apparatus for avoiding damage when analysing a sample surface with a scanning probe microscope | Hans Hermann Pieper, Christof Baur | 2018-06-12 |