WR

Weiming Ren

AB Asml Netherlands B.V.: 55 patents #48 of 3,192Top 2%
HM Hermes Microvision: 42 patents #3 of 68Top 5%
EB Ebara: 2 patents #752 of 1,611Top 50%
NI Nikon: 1 patents #1,647 of 2,493Top 70%
📍 San Jose, CA: #268 of 32,062 inventorsTop 1%
🗺 California: #2,278 of 386,348 inventorsTop 1%
Overall (All Time): #14,619 of 4,157,543Top 1%
99
Patents All Time

Issued Patents All Time

Showing 76–99 of 99 patents

Patent #TitleCo-InventorsDate
9048063 Electron beam apparatus Shuai Li, Zhongwei Chen 2015-06-02
9048062 Method for improving performance of an energy filter Shuai Li, Zhongwei Chen 2015-06-02
9000369 System and method for controlling charge-up in an electron beam apparatus Zhongwei Chen 2015-04-07
9000395 Energy filter for charged particle beam apparatus Shuai Li, Zhongwei Chen 2015-04-07
9000394 Multi-axis magnetic lens for focusing a plurality of charged particle beams Zhongwei Chen 2015-04-07
9000370 System and method for controlling charge-up in an electron beam apparatus Zhongwei Chen 2015-04-07
8907281 System and method for controlling charge-up in an electron beam apparatus Zhongwei Chen 2014-12-09
8835867 Multi-axis magnetic lens for focusing a plurality of charged particle beams Zhongwei Chen, Xuedong Liu 2014-09-16
8791425 Multi-axis magnetic lens for focusing a plurality of charged particle beams Zongwei CHEN 2014-07-29
8618480 Charged particle beam apparatus Xiaoli Guo, Xuedong Liu, Zhongwei Chen 2013-12-31
8592761 Monochromator for charged particle beam apparatus Zhongwei Chen 2013-11-26
8552377 Particle detection system Yi Wang, Joe Wang 2013-10-08
8445862 Apparatus of plural charged particle beams with multi-axis magnetic lens Zhongwei Chen, Kenichi Kanai, Xuedong Liu 2013-05-21
8436317 Wien filter Zhongwei Chen, Xuedong Liu 2013-05-07
8421029 Wien filter with reduced field leakage Xuedong Liu, Zhongwei Chen 2013-04-16
8319192 Charged particle apparatus 2012-11-27
8294095 Apparatus of plural charged particle beams with multi-axis magnetic lens Zhongwei Chen, Kenichi Kanai, Xuedong Liu 2012-10-23
8274046 Monochromator for charged particle beam apparatus Zhongwei Chen 2012-09-25
8094924 E-beam defect review system Jack Jau, Zhongwei Chen, Yi Wang, Chung-Shih Pan, Joe Wang +2 more 2012-01-10
8003953 Multi-axis magnetic lens Zhongwei Chen, Kenichi Kanai, Xuedong Liu 2011-08-23
7960697 Electron beam apparatus Zhongwei Chen, Joe Wang, Xuedong Liu, Juying Dou, Fumin He +5 more 2011-06-14
7855364 Projection electronic microscope for reducing geometric aberration and space charge effect Takeshi Murakami 2010-12-21
7759653 Electron beam apparatus Zhong-Wei Chen, Xuedong Liu, Xu Zhang, Juying Dou 2010-07-20
7423268 Projection imaging type electron microscope 2008-09-09