FA

Filippo ALPEGGIANI

AB Asml Netherlands B.V.: 2 patents #1,484 of 3,192Top 50%
Overall (All Time): #1,328,313 of 4,157,543Top 35%
3
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Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
12287591 Lithographic apparatus, metrology systems, and methods thereof Arjan Johannes Anton Beukman, Sebastianus Adrianus GOORDEN, Stephen Roux, Sergei Sokolov 2025-04-29
12025925 Metrology method and lithographic apparatuses Henricus Petrus Maria Pellemans, Sebastianus Adrianus GOORDEN, Simon Reinald HUISMAN 2024-07-02
11762305 Alignment method Sergei Sokolov, Sebastianus Adrianus GOORDEN, Simon Reinald HUISMAN 2023-09-19