Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12112260 | Metrology apparatus and method for determining a characteristic of one or more structures on a substrate | Lorenzo Tripodi, Patrick Warnaar, Grzegorz Grzela, Mohammadreza Hajiahmadi, Patricius Aloysius Jacobus Tinnemans +5 more | 2024-10-08 |
| 10794693 | Metrology method, apparatus and computer program | Mohammadreza Hajiahmadi, Maurits Van Der Schaar, Murat Bozkurt | 2020-10-06 |
| 10451978 | Metrology parameter determination and metrology recipe selection | Kaustuve Bhattacharyya, Simon Gijsbert Josephus Mathijssen, Marc Johannes Noot, Arie Jeffrey Den Boef, Mohammadreza Hajiahmadi | 2019-10-22 |