SS

Sergey Starik

Applied Materials: 10 patents #1,290 of 7,310Top 20%
Overall (All Time): #487,733 of 4,157,543Top 15%
10
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12062583 Optical metrology models for in-line film thickness measurements Eric Ng, Edward W. Budiarto, Todd Egan 2024-08-13
11898249 PECVD process Nagarajan Rajagopalan, Xinhai Han, Michael Wenyoung Tsiang, Masaki Ogata, Zhijun Jiang +17 more 2024-02-13
11613812 PECVD process Nagarajan Rajagopalan, Xinhai Han, Michael Wenyoung Tsiang, Masaki Ogata, Zhijun Jiang +17 more 2023-03-28
10793954 PECVD process Nagarajan Rajagopalan, Xinhai Han, Michael Wenyoung Tsiang, Masaki Ogata, Zhijun Jiang +17 more 2020-10-06
10060032 PECVD process Nagarajan Rajagopalan, Xinhai Han, Michael Wenyoung Tsiang, Masaki Ogata, Zhijun Jiang +17 more 2018-08-28
10030306 PECVD apparatus and process Nagarajan Rajagopalan, Xinhai Han, Michael Wenyoung Tsiang, Masaki Ogata, Zhijun Jiang +17 more 2018-07-24
9816187 PECVD process Nagarajan Rajagopalan, Xinhai Han, Michael Wenyoung Tsiang, Masaki Ogata, Zhijun Jiang +17 more 2017-11-14
9490154 Method of aligning substrate-scale mask with substrate Abraham Ravid, Todd Egan, Paul Connors, Ganesh Balasubramanian 2016-11-08
9458537 PECVD process Nagarajan Rajagopalan, Xinhai Han, Michael Wenyoung Tsiang, Masaki Ogata, Zhijun Jiang +17 more 2016-10-04
9157730 PECVD process Nagarajan Rajagopalan, Xinhai Han, Michael Wenyoung Tsiang, Masaki Ogata, Zhijun Jiang +17 more 2015-10-13