RK

Rainer Knippelmeyer

Applied Materials: 18 patents #731 of 7,310Top 10%
CG Carl Zeiss Microscopy Gmbh: 14 patents #23 of 564Top 5%
CG Carl Zeiss Nts Gmbh: 10 patents #2 of 103Top 2%
KL Kla-Tencor: 5 patents #301 of 1,394Top 25%
CG Carl Zeiss Smt Gmbh: 3 patents #370 of 1,189Top 35%
KL Kla: 3 patents #125 of 758Top 20%
CA Carl Ziess Smt Ag: 2 patents #1 of 34Top 3%
📍 Aalen, MA: #2 of 2 inventorsTop 100%
Overall (All Time): #86,076 of 4,157,543Top 3%
38
Patents All Time

Issued Patents All Time

Showing 26–38 of 38 patents

Patent #TitleCo-InventorsDate
8097847 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Oliver Kienzle, Thomas Kemen, Heiko Mueller, Stephan Uhlemann, Maximilian Haider +1 more 2012-01-17
8039813 Charged particle-optical systems, methods and components Antonio Casares, Thomas Kemen, Thomas Bayer, Georg Fritz, Johann Greschner +1 more 2011-10-18
7554094 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Oliver Kienzle, Thomas Kemen, Heiko Mueller, Stephan Uhlemann, Maximilian Haider +1 more 2009-06-30
7244949 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Oliver Kienzle 2007-07-17
7135677 Beam guiding arrangement, imaging method, electron microscopy system and electron lithography system Oliver Kienzle, Stephan Uhlemann, Max Haider, Heiko Müller 2006-11-14
7105814 Electron microscopy system and electron microscopy method 2006-09-12
7084406 Detector arrangement and detection method 2006-08-01
6967328 Method for the electron-microscopic observation of a semiconductor arrangement and apparatus therefor Oliver Kienzle, Ingo Muller 2005-11-22
6946657 Electron microscopy system Oliver Kienzle, Heiko Müller 2005-09-20
6914249 Particle-optical apparatus, electron microscopy system and electron lithography system Oliver Kienzle 2005-07-05
6903337 Examining system for the particle-optical imaging of an object, deflector for charged particles as well as method for the operation of the same Oliver Kienzle, Dirk Stenkamp, Michael Steigerwald, Max Haider, Heiko Müller +1 more 2005-06-07
6891168 Particle-optical apparatus and method for operating the same 2005-05-10
6878936 Applications operating with beams of charged particles Oliver Kienzle 2005-04-12