Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6734088 | Control of two-step gate etch process | Matthew A. Purdy, Scott Bushman, Douglas J. Bonser | 2004-05-11 |
| 6728591 | Method and apparatus for run-to-run control of trench profiles | Matthew A. Purdy | 2004-04-27 |
| 6555397 | Dry isotropic removal of inorganic anti-reflective coating after poly gate etching | Douglas J. Bonser, Matthew A. Purdy | 2003-04-29 |
| 6245581 | Method and apparatus for control of critical dimension using feedback etch control | Douglas J. Bonser, Anthony J. Toprac, Matthew A. Purdy, John R. Behnke | 2001-06-12 |
| 5472774 | Photolithography test structure | Howard S. Goad, Derick J. Wristers, Michael A. Hillis, William C. Chapman | 1995-12-05 |
| 5370923 | Photolithography test structure | Howard S. Goad, Derick J. Wristers, Michael A. Hillis, William C. Chapman | 1994-12-06 |
| 4501614 | Flux in recovery of aluminum in reverberatory furnace and method of making | Carl F. Bauer, Benny Langston, Niranjan M. Parikh | 1985-02-26 |
| 4451287 | Flux in recovery of aluminum in reverberatory furnace | Carl F. Bauer, Benny Langston | 1984-05-29 |