Issued Patents All Time
Showing 26–44 of 44 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6628961 | Device and a method for connecting a mobile phone handset to an external keyboard | Martin Ho | 2003-09-30 |
| 6600188 | EEPROM with a neutralized doping at tunnel window edge | Sunil Mehta | 2003-07-29 |
| 6593632 | Interconnect methodology employing a low dielectric constant etch stop layer | Steven C. Avanzino, Minh Van Ngo, Angela T. Hui, Hamid Partovi | 2003-07-15 |
| 6545313 | EEPROM tunnel window for program injection via P+ contacted inversion | Robert H. Tu, Sunil Mehta | 2003-04-08 |
| 6455375 | Eeprom tunnel window for program injection via P+ contacted inversion | Robert H. Tu, Sunil Mehta | 2002-09-24 |
| 6440839 | Selective air gap insulation | Hamid Partovi, Bill Liu | 2002-08-27 |
| 6307541 | Method and system for inputting chinese-characters through virtual keyboards to data processor | Chi-Yu Ho, Chang Wang | 2001-10-23 |
| 6166558 | Method for measuring gate length and drain/source gate overlap | Wei Long, Zicheng Gary Ling, Yowjuang W. Liu | 2000-12-26 |
| 6137126 | Method to reduce gate-to-local interconnect capacitance using a low dielectric constant material for LDD spacer | Steven C. Avanzino, Minh Van Ngo, Angela T. Hui, Hamid Partovi | 2000-10-24 |
| 6110219 | Model for taking into account gate resistance induced propagation delay | — | 2000-08-29 |
| 6099576 | System for designing and manufacturing CMOS inverters by estimating gate RC delay | — | 2000-08-08 |
| 6069485 | C-V method to extract lateral channel doping profiles of MOSFETs | Wei Long, Yowjuang W. Liu | 2000-05-30 |
| 5986477 | Method and system for providing an interconnect layout to reduce delays in logic circuits | Linda Milor | 1999-11-16 |
| 5925914 | Asymmetric S/D structure to improve transistor performance by reducing Miller capacitance | David Wu | 1999-07-20 |
| 5714785 | Asymmetric drain/source layout for robust electrostatic discharge protection | — | 1998-02-03 |
| 5712200 | N-well resistor as a ballast resistor for output MOSFET | — | 1998-01-27 |
| 5637902 | N-well resistor as a ballast resistor for output MOSFET | — | 1997-06-10 |
| 5587665 | Testing hot carrier induced degradation to fall and rise time of CMOS inverter circuits | — | 1996-12-24 |
| 5339270 | AC drain voltage charging source for PROM devices | — | 1994-08-16 |