CK

Christian Krueger

AM AMD: 11 patents #1,098 of 9,279Top 15%
WARF: 11 patents #123 of 4,123Top 3%
Basf Se: 9 patents #1,877 of 13,826Top 15%
Daimlerchrysler Ag: 2 patents #969 of 4,854Top 20%
DA Daimler Ag: 1 patents #789 of 2,089Top 40%
SA Syngenta Crop Protection Ag: 1 patents #315 of 703Top 45%
SA Syngenta Participations Ag: 1 patents #620 of 1,106Top 60%
Infineon Technologies Ag: 1 patents #4,439 of 7,486Top 60%
Globalfoundries: 1 patents #2,221 of 4,424Top 55%
🗺 Wisconsin: #614 of 40,088 inventorsTop 2%
Overall (All Time): #77,372 of 4,157,543Top 2%
40
Patents All Time

Issued Patents All Time

Showing 26–40 of 40 patents

Patent #TitleCo-InventorsDate
7816656 Method of implanting ion species into microstructure products by concurrently cleaning the implanter Rastislav Kocis, Marek Braun, Niels-Wieland Hauptmann, Heinz H. Seidel 2010-10-19
7816273 Technique for removing resist material after high dose implantation in a semiconductor device Volker Grimm, Lutz Eckart 2010-10-19
7513239 Compression ignition internal combustion engine Matthias Blessing, Harald Braun, Frank Keller, Gerhard Koenig, Alois Raab 2009-04-07
7504838 Methods of determining characteristics of doped regions on device wafers, and system for accomplishing same Zhiyong Zhao 2009-03-17
7225791 Compression-ignition internal combustion engine Matthias Blessing, Harald Braun, Frank Keller, Gerhard Koenig, Alois Raab 2007-06-05
7063991 Methods of determining characteristics of doped regions on device wafers, and system for accomplishing same Zhiyong Zhao 2006-06-20
7059295 Self-igniting internal combustion engine Matthias Blessing, Gerhard Koenig, Ruediger Preiss, Alois Raab, Martin Schnabel 2006-06-13
7026628 Advanced ion beam detector for ion implantation tools 2006-04-11
6949399 Method of reducing contamination-induced process variations during ion implantation Niels-Wieland Hauptmann, Thomas Beck 2005-09-27
6897114 Methods of forming a transistor having a recessed gate electrode structure Thomas Feudel, Volker Grimm 2005-05-24
6852984 Advanced ion beam measurement tool for an ion implantation apparatus 2005-02-08
6812074 SOI field effect transistor element having a recombination region and method of forming same Karsten Wieczorek, Manfred Horstmann 2004-11-02
6808970 Semiconductor device having an improved strained surface layer and method of forming a strained surface layer in a semiconductor device Thomas Feudel, Lutz Herrmann 2004-10-26
6754553 Implant monitoring using multiple implanting and annealing steps Karsten Wieczorek, Manfred Horstmann 2004-06-22
6380135 Agrochemical compositions Karl-Heinz Reuter 2002-04-30