Issued Patents 2025
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12422363 | Scanning scatterometry overlay metrology | Amnon Manassen, Yuri Paskover, Itay Gdor, Yonatan Vaknin, Yuval Lubashevsky | 2025-09-23 |
| 12379669 | Massive overlay metrology sampling with multiple measurement columns | Jonathan M. Madsen, Andrei V. Shchegrov, Amnon Manassen, Yossi Simon, Gilad Laredo +1 more | 2025-08-05 |
| 12327741 | Oscillating secondary stage for frame-mode overlay metrology | Izhar Agam, Yoram Uziel, Amnon Manassen, Daria Negri | 2025-06-10 |
| 12235588 | Scanning overlay metrology with high signal to noise ratio | Amnon Manassen, Vladimir Levinski | 2025-02-25 |