Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12379669 | Massive overlay metrology sampling with multiple measurement columns | Jonathan M. Madsen, Amnon Manassen, Andrew V. Hill, Yossi Simon, Gilad Laredo +1 more | 2025-08-05 |