Issued Patents 2025
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12422363 | Scanning scatterometry overlay metrology | Andrew V. Hill, Yuri Paskover, Itay Gdor, Yonatan Vaknin, Yuval Lubashevsky | 2025-09-23 |
| 12399435 | Grating-over-grating overlay measurement with parallel color per layer | Yonatan Vaknin | 2025-08-26 |
| 12379669 | Massive overlay metrology sampling with multiple measurement columns | Jonathan M. Madsen, Andrei V. Shchegrov, Andrew V. Hill, Yossi Simon, Gilad Laredo +1 more | 2025-08-05 |
| 12372345 | 3D profilometry with a Linnik interferometer | Yoav Grauer, Shlomo Eisenbach, Stephen Hiebert, Avner Safrani, Roel Gronheid | 2025-07-29 |
| 12327741 | Oscillating secondary stage for frame-mode overlay metrology | Izhar Agam, Andrew V. Hill, Yoram Uziel, Daria Negri | 2025-06-10 |
| 12253805 | Scatterometry overlay metrology with orthogonal fine-pitch segmentation | Vladimir Levinski, Daria Negri | 2025-03-18 |
| 12235588 | Scanning overlay metrology with high signal to noise ratio | Andrew V. Hill, Vladimir Levinski | 2025-02-25 |
| 12222199 | Systems and methods for measurement of misregistration and amelioration thereof | Roie Volkovich, Nachshon Rothman, Yossi Simon, Anna Golotsvan, Vladimir Levinski +3 more | 2025-02-11 |