Issued Patents 2025
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12422363 | Scanning scatterometry overlay metrology | Amnon Manassen, Andrew V. Hill, Yuri Paskover, Itay Gdor, Yuval Lubashevsky | 2025-09-23 |
| 12399435 | Grating-over-grating overlay measurement with parallel color per layer | Amnon Manassen | 2025-08-26 |