Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12422363 | Scanning scatterometry overlay metrology | Amnon Manassen, Andrew V. Hill, Yuri Paskover, Itay Gdor, Yonatan Vaknin | 2025-09-23 |
| 12373936 | System and method for overlay metrology using a phase mask | Iftach Galon, Itay Gdor, Yaniv Weiss, Nireekshan K. Reddy | 2025-07-29 |