Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12373936 | System and method for overlay metrology using a phase mask | Iftach Galon, Itay Gdor, Yuval Lubashevsky, Yaniv Weiss | 2025-07-29 |
| 12222199 | Systems and methods for measurement of misregistration and amelioration thereof | Roie Volkovich, Nachshon Rothman, Yossi Simon, Anna Golotsvan, Vladimir Levinski +3 more | 2025-02-11 |