Issued Patents 2025
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12411420 | Small in-die target design for overlay measurement | — | 2025-09-09 |
| 12253805 | Scatterometry overlay metrology with orthogonal fine-pitch segmentation | Daria Negri, Amnon Manassen | 2025-03-18 |
| 12235588 | Scanning overlay metrology with high signal to noise ratio | Amnon Manassen, Andrew V. Hill | 2025-02-25 |
| 12222199 | Systems and methods for measurement of misregistration and amelioration thereof | Roie Volkovich, Nachshon Rothman, Yossi Simon, Anna Golotsvan, Nireekshan K. Reddy +3 more | 2025-02-11 |