NL

Nicolas Loubet

IBM: 9 patents #56 of 3,866Top 2%
BS Bell Semiconductor: 3 patents #1 of 4Top 25%
SS Stmicroelectronics Sa: 1 patents #7 of 38Top 20%
📍 Guilderland, NY: #1 of 7 inventorsTop 15%
🗺 New York: #68 of 9,062 inventorsTop 1%
Overall (2025): #3,478 of 469,880Top 1%
13
Patents 2025

Issued Patents 2025

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
12426228 SRAM with staggered stacked FET Kirsten Emilie Moselund, Bogdan Cezar Zota 2025-09-23
12414328 Co-integrating gate-all-around nanosheet transistors and comb-nanosheet transistors Huimei Zhou, Julien Frougier, Ruilong Xie, Miaomiao Wang, Veeraraghavan S. Basker 2025-09-09
12408368 Method of making a semiconductor device using a dummy gate Prasanna Khare 2025-09-02
12402408 Stacked FETS including devices with thick gate oxide Ruilong Xie, Julien Frougier, Junli Wang, Ruqiang Bao, Min Gyu Sung +2 more 2025-08-26
12336294 Gate-cut and separation techniques for enabling independent gate control of stacked transistors Ruilong Xie, Julien Frougier, Lawrence A. Clevenger, Prasad Bhosale, Junli Wang +2 more 2025-06-17
12317555 Gate-all-around nanosheet field effect transistor integrated with fin field effect transistor Julien Frougier, Sagarika Mukesh, Ruqiang Bao, Andrew M. Greene, Jingyun Zhang +1 more 2025-05-27
12310100 Dielectric reflow for boundary control Jing Guo, Ekmini Anuja De Silva, Indira Seshadri, Ruqiang Bao, Nelson Felix 2025-05-20
12278234 Multi-fin FINFET device including epitaxial growth barrier on outside surfaces of outermost fins and related methods Qing Liu, Prasanna Khare 2025-04-15
12268020 Source or drain template for reducing strain loss in spaced-apart nanosheet channels Shogo Mochizuki 2025-04-01
12261173 Semiconductor device with strained channel Shogo Mochizuki 2025-03-25
12237325 Three-dimensional field effect device Huimei Zhou, Su Chen Fan, Shogo Mochizuki, Peng Xu 2025-02-25
12211936 Strained-channel fin FETs Pierre Morin 2025-01-28
12191309 Method to induce strain in finFET channels from an adjacent region Pierre Morin 2025-01-07