Issued Patents 2025
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12332573 | Method for determining defectiveness of pattern based on after development image | Marleen KOOIMAN, Maxim PISARENCO, Abraham SLACHTER, Mark John Maslow, Bernardo Andres OYARZUN RIVERA +1 more | 2025-06-17 |
| 12315175 | Method in the manufacturing process of a device, a non-transitory computer-readable medium and a system configured to perform the method | Antoine Gaston Marie Kiers, Vadim Yourievich TIMOSHKOV, Hermanus Adrianus DILLEN, Yichen Zhang, Te-Sheng WANG +1 more | 2025-05-27 |
| 12228862 | Selection of measurement locations for patterning processes | Hans Van Der Laan, Marinus Jochemsen, Stefan Hunsche | 2025-02-18 |
| 12210293 | Method for determining a measurement recipe and associated apparatuses | Adriaan Johan Van Leest | 2025-01-28 |
| 12197136 | Method of determining control parameters of a device manufacturing process | Mark John Maslow, Koenraad VAN INGEN SCHENAU, Patrick Warnaar, Abraham SLACHTER, Roy ANUNCIADO +3 more | 2025-01-14 |
| 12189302 | Computational metrology | Bart Peter Bert Segers, Everhardus Cornelis Mos, Emil Peter Schmitt-Weaver, Yichen Zhang, Petrus Gerardus Van Rhee +4 more | 2025-01-07 |