Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12332573 | Method for determining defectiveness of pattern based on after development image | Marleen KOOIMAN, Maxim PISARENCO, Abraham SLACHTER, Bernardo Andres OYARZUN RIVERA, Wim Tjibbo Tel +1 more | 2025-06-17 |
| 12197136 | Method of determining control parameters of a device manufacturing process | Wim Tjibbo Tel, Koenraad VAN INGEN SCHENAU, Patrick Warnaar, Abraham SLACHTER, Roy ANUNCIADO +3 more | 2025-01-14 |