Issued Patents 2025
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12332573 | Method for determining defectiveness of pattern based on after development image | Marleen KOOIMAN, Abraham SLACHTER, Mark John Maslow, Bernardo Andres OYARZUN RIVERA, Wim Tjibbo Tel +1 more | 2025-06-17 |
| 12321101 | Method for applying a deposition model in a semiconductor manufacturing process | Maurits Van Der Schaar, Huaichen ZHANG, Marie-Claire VAN LARE | 2025-06-03 |
| 12271114 | Method and apparatus for predicting substrate image | Scott Anderson Middlebrooks, Adrianus Cornelis Matheus Koopman, Markus Gerardus Martinus Maria Van Kraaij, Stefan Hunsche | 2025-04-08 |
| 12259659 | Aligning a distorted image | Coen Adrianus Verschuren, Scott Anderson Middlebrooks | 2025-03-25 |
| 12204252 | Method for decision making in a semiconductor manufacturing process | Arnaud HUBAUX, Johan Franciscus Maria Beckers, Dylan John David Davies, Johan Gertrudis Cornelis Kunnen, Willem Richard Pongers +7 more | 2025-01-21 |