Issued Patents 2025
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12386268 | Method for calibrating simulation process based on defect-based process window | Koenraad VAN INGEN SCHENAU, Abraham SLACHTER, Vadim Yourievich TIMOSHKOV, Marleen KOOIMAN, Marie-Claire VAN LARE +5 more | 2025-08-12 |
| 12360461 | Identification of hot spots or defects by machine learning | Jing Su, Yi Zou, Chenxi Lin, Marinus Jochemsen, Yen-Wen Lu +1 more | 2025-07-15 |
| 12271114 | Method and apparatus for predicting substrate image | Scott Anderson Middlebrooks, Adrianus Cornelis Matheus Koopman, Markus Gerardus Martinus Maria Van Kraaij, Maxim PISARENCO | 2025-04-08 |
| 12228862 | Selection of measurement locations for patterning processes | Hans Van Der Laan, Wim Tjibbo Tel, Marinus Jochemsen | 2025-02-18 |
| 12189307 | Metrology data correction using image quality metric | Fuming Wang, Wei Fang | 2025-01-07 |