Issued Patents 2025
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12354833 | Multiple landing energy scanning electron microscopy systems and methods | Weiming Ren, Zhong-Wei Chen | 2025-07-08 |
| 12308205 | Beam current adjustment for charged-particle inspection system | Zhong-Wei Chen | 2025-05-20 |
| 12230013 | Fully automated SEM sampling system for e-beam image enhancement | Wentian ZHOU, Liangjiang YU, Teng Wang, Lingling PU | 2025-02-18 |
| 12189307 | Metrology data correction using image quality metric | Fuming Wang, Stefan Hunsche | 2025-01-07 |
| 12191112 | System and method for defect inspection using voltage contrast in a charged particle system | Zhengwei Zhou, Lingling PU | 2025-01-07 |