Issued Patents 2025
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12354833 | Multiple landing energy scanning electron microscopy systems and methods | Wei Fang, Weiming Ren | 2025-07-08 |
| 12347643 | Multiple charged-particle beam apparatus and methods of operating the same using movable lenses | Weiming Ren, Xuedong Liu, Xuerang Hu | 2025-07-01 |
| 12308205 | Beam current adjustment for charged-particle inspection system | Wei Fang | 2025-05-20 |
| 12278081 | System and method for alignment of secondary beams in multi-beam inspection apparatus | Qingpo Xi, Xuerang Hu, Xuedong Liu, Weiming Ren | 2025-04-15 |
| 12243709 | Apparatus using multiple charged particle beams | Weiming Ren, Xuedong Liu, Xuerang Hu | 2025-03-04 |
| 12237144 | Apparatus using multiple beams of charged particles | Xuerang Hu, Weiming Ren, Xuedong Liu | 2025-02-25 |
| 12211669 | Multiple charged-particle beam apparatus with low crosstalk | Weiming Ren, Zizhou GONG, Xuerang Hu, Xuedong Liu | 2025-01-28 |
| 12196692 | Systems and methods for voltage contrast defect detection | Weiming Ren, Xuedong Liu, Xiaoyu JI, Xiaoxue CHEN, Weimin Zhou +1 more | 2025-01-14 |