Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12230013 | Fully automated SEM sampling system for e-beam image enhancement | Wentian ZHOU, Liangjiang YU, Teng Wang, Wei Fang | 2025-02-18 |
| 12191112 | System and method for defect inspection using voltage contrast in a charged particle system | Wei Fang, Zhengwei Zhou | 2025-01-07 |