Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12386268 | Method for calibrating simulation process based on defect-based process window | Koenraad VAN INGEN SCHENAU, Abraham SLACHTER, Vadim Yourievich TIMOSHKOV, Marleen KOOIMAN, Hermanus Adrianus DILLEN +5 more | 2025-08-12 |
| 12321101 | Method for applying a deposition model in a semiconductor manufacturing process | Maxim PISARENCO, Maurits Van Der Schaar, Huaichen ZHANG | 2025-06-03 |
| 12197120 | Patterning device and method of use thereof | Frank Jan TIMMERMANS, Friso Wittebrood, John Martin McNamara, Jozef Maria Finders | 2025-01-14 |