Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12386268 | Method for calibrating simulation process based on defect-based process window | Koenraad VAN INGEN SCHENAU, Abraham SLACHTER, Vadim Yourievich TIMOSHKOV, Marleen KOOIMAN, Marie-Claire VAN LARE +5 more | 2025-08-12 |
| 12315175 | Method in the manufacturing process of a device, a non-transitory computer-readable medium and a system configured to perform the method | Wim Tjibbo Tel, Antoine Gaston Marie Kiers, Vadim Yourievich TIMOSHKOV, Yichen Zhang, Te-Sheng WANG +1 more | 2025-05-27 |