Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12386268 | Method for calibrating simulation process based on defect-based process window | Koenraad VAN INGEN SCHENAU, Abraham SLACHTER, Vadim Yourievich TIMOSHKOV, Marie-Claire VAN LARE, Hermanus Adrianus DILLEN +5 more | 2025-08-12 |
| 12332573 | Method for determining defectiveness of pattern based on after development image | Maxim PISARENCO, Abraham SLACHTER, Mark John Maslow, Bernardo Andres OYARZUN RIVERA, Wim Tjibbo Tel +1 more | 2025-06-17 |