Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12360461 | Identification of hot spots or defects by machine learning | Jing Su, Yi Zou, Chenxi Lin, Stefan Hunsche, Yen-Wen Lu +1 more | 2025-07-15 |
| 12228862 | Selection of measurement locations for patterning processes | Hans Van Der Laan, Wim Tjibbo Tel, Stefan Hunsche | 2025-02-18 |
| 12197136 | Method of determining control parameters of a device manufacturing process | Wim Tjibbo Tel, Mark John Maslow, Koenraad VAN INGEN SCHENAU, Patrick Warnaar, Abraham SLACHTER +3 more | 2025-01-14 |