Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12131959 | Systems and methods for improved metrology for semiconductor device wafers | Daria Negri, Ohad Bachar, Yossi Simon, Amnon Manassen, Nir Ben David +2 more | 2024-10-29 |
| 11971664 | Reducing device overlay errors | Roie Volkovich | 2024-04-30 |
| 11880142 | Self-calibrating overlay metrology | Stilian Ivanov Pandev, Min-Yeong Moon, Andrei V. Shchegrov, Jonathan M. Madsen, Dimitry Sanko +2 more | 2024-01-23 |