Issued Patents 2024
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12131959 | Systems and methods for improved metrology for semiconductor device wafers | Liran Yerushalmi, Daria Negri, Ohad Bachar, Yossi Simon, Amnon Manassen +2 more | 2024-10-29 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12131959 | Systems and methods for improved metrology for semiconductor device wafers | Liran Yerushalmi, Daria Negri, Ohad Bachar, Yossi Simon, Amnon Manassen +2 more | 2024-10-29 |