Issued Patents 2024
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12066322 | Single grab overlay measurement of tall targets | Amnon Manassen, Yonatan Vaknin, Avner Safrani | 2024-08-20 |
| 12032300 | Imaging overlay with mutually coherent oblique illumination | Vladimir Levinski, Daria Negri, Amnon Manassen, Yonatan Vaknin | 2024-07-09 |
| 12001148 | Enhancing performance of overlay metrology | Amnon Manassen, Yonatan Vaknin, Yossi Simon, Daria Negri, Vladimir Levinski +9 more | 2024-06-04 |
| 11933717 | Sensitive optical metrology in scanning and static modes | Amnon Manassen, Yoram Uziel, Yossi Simon, Gilad Laredo | 2024-03-19 |
| 11899375 | Massive overlay metrology sampling with multiple measurement columns | Jonathan M. Madsen, Andrei V. Shchegrov, Amnon Manassen, Yossi Simon, Gilad Laredo +1 more | 2024-02-13 |