Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12066322 | Single grab overlay measurement of tall targets | Amnon Manassen, Andrew V. Hill, Yonatan Vaknin | 2024-08-20 |
| 11921825 | System and method for determining target feature focus in image-based overlay metrology | Etay Lavert, Amnon Manassen, Yossi Simon, Dimitry Sanko | 2024-03-05 |
| 11908722 | Automatic teaching of substrate handling for production and process-control tools | Shai Mark, Amir Aizen, Maor Arbit | 2024-02-20 |