Issued Patents 2024
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12131959 | Systems and methods for improved metrology for semiconductor device wafers | Liran Yerushalmi, Daria Negri, Ohad Bachar, Yossi Simon, Amnon Manassen +2 more | 2024-10-29 |
| 12001148 | Enhancing performance of overlay metrology | Amnon Manassen, Andrew V. Hill, Yonatan Vaknin, Yossi Simon, Daria Negri +9 more | 2024-06-04 |
| 11967535 | On-product overlay targets | Amnon Manassen, Vladimir Levinski, Ido Dolev | 2024-04-23 |
| 11933717 | Sensitive optical metrology in scanning and static modes | Andrew V. Hill, Amnon Manassen, Yossi Simon, Gilad Laredo | 2024-03-19 |
| 11899375 | Massive overlay metrology sampling with multiple measurement columns | Jonathan M. Madsen, Andrei V. Shchegrov, Amnon Manassen, Andrew V. Hill, Yossi Simon +1 more | 2024-02-13 |