Issued Patents 2024
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11933717 | Sensitive optical metrology in scanning and static modes | Andrew V. Hill, Amnon Manassen, Yoram Uziel, Yossi Simon | 2024-03-19 |
| 11899375 | Massive overlay metrology sampling with multiple measurement columns | Jonathan M. Madsen, Andrei V. Shchegrov, Amnon Manassen, Andrew V. Hill, Yossi Simon +1 more | 2024-02-13 |
| 11880141 | Method of measuring misregistration in the manufacture of topographic semiconductor device wafers | Daria Negri, Amnon Manassen | 2024-01-23 |