Issued Patents 2024
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12170215 | Systems and methods for correction of impact of wafer tilt on misregistration measurements | Vladimir Levinski, Amnon Manassen | 2024-12-17 |
| 12165930 | Adaptive modeling misregistration measurement system and method | Amnon Manassen, Vladimir Levinski, Nireekshan K. Reddy | 2024-12-10 |
| 12131959 | Systems and methods for improved metrology for semiconductor device wafers | Liran Yerushalmi, Ohad Bachar, Yossi Simon, Amnon Manassen, Nir Ben David +2 more | 2024-10-29 |
| 12105414 | Targets for diffraction-based overlay error metrology | Itay Gdor, Yuval Lubashevsky, Eitan Hajaj, Vladimir Levinski | 2024-10-01 |
| 12105431 | Annular apodizer for small target overlay measurement | Itay Gdor, Yuval Lubashevsky, Alon Alexander Volfman, Yevgeniy Men, Elad Farchi | 2024-10-01 |
| 12080610 | Wavelet system and method for ameliorating misregistration and asymmetry of semiconductor devices | Lilach Saltoun | 2024-09-03 |
| 12032300 | Imaging overlay with mutually coherent oblique illumination | Andrew V. Hill, Vladimir Levinski, Amnon Manassen, Yonatan Vaknin | 2024-07-09 |
| 12001148 | Enhancing performance of overlay metrology | Amnon Manassen, Andrew V. Hill, Yonatan Vaknin, Yossi Simon, Vladimir Levinski +9 more | 2024-06-04 |
| 11879632 | System and method for generating light | Carmel Rotschild, Michal Shimanovich, Matej Kurtulik | 2024-01-23 |
| 11880141 | Method of measuring misregistration in the manufacture of topographic semiconductor device wafers | Amnon Manassen, Gilad Laredo | 2024-01-23 |