Issued Patents 2023
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11592755 | Enhancing performance of overlay metrology | Amnon Manassen, Andrew V. Hill, Yonatan Vaknin, Daria Negri, Vladimir Levinski +9 more | 2023-02-28 |
| 11556738 | System and method for determining target feature focus in image-based overlay metrology | Etay Lavert, Amnon Manassen, Dimitry Sanko, Avner Safrani | 2023-01-17 |