Issued Patents 2023
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11556738 | System and method for determining target feature focus in image-based overlay metrology | Amnon Manassen, Yossi Simon, Dimitry Sanko, Avner Safrani | 2023-01-17 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11556738 | System and method for determining target feature focus in image-based overlay metrology | Amnon Manassen, Yossi Simon, Dimitry Sanko, Avner Safrani | 2023-01-17 |