Issued Patents 2022
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11450541 | Metrology method and system | Vladimir Machavariani, Michael Shifrin, Daniel Kandel, Victor Kucherov, Igor Ziselman +1 more | 2022-09-20 |
| 11309162 | TEM-based metrology method and system | Vladimir Machavariani, Michael Shifrin, Daniel Kandel, Victor Kucherov, Igor Ziselman +1 more | 2022-04-19 |
| 11300948 | Process control of semiconductor fabrication based on spectra quality metrics | Taher Kagalwala, Alok Vaid, Shay Yogev, Paul ISBESTER, Yoav Etzioni | 2022-04-12 |
| 11295969 | Hybridization for characterization and metrology | Gangadhara Raja Muthinti, Roy Koret, Aron Cepler, Wei Ti Lee | 2022-04-05 |