Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11450541 | Metrology method and system | Michael Shifrin, Daniel Kandel, Victor Kucherov, Igor Ziselman, Ronen Urenski +1 more | 2022-09-20 |
| 11309162 | TEM-based metrology method and system | Michael Shifrin, Daniel Kandel, Victor Kucherov, Igor Ziselman, Ronen Urenski +1 more | 2022-04-19 |
| 11275027 | Raman spectroscopy based measurements in patterned structures | Gilad Barak, Yanir Hainick, Yonatan Oren | 2022-03-15 |