Issued Patents 2022
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11450541 | Metrology method and system | Vladimir Machavariani, Michael Shifrin, Victor Kucherov, Igor Ziselman, Ronen Urenski +1 more | 2022-09-20 |
| 11372340 | Method and system for providing a quality metric for improved process control | Guy M. Cohen, Dana Klein, Vladimir Levinski, Noam Sapiens, Alex Shulman +3 more | 2022-06-28 |
| 11309162 | TEM-based metrology method and system | Vladimir Machavariani, Michael Shifrin, Victor Kucherov, Igor Ziselman, Ronen Urenski +1 more | 2022-04-19 |