Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11450541 | Metrology method and system | Vladimir Machavariani, Michael Shifrin, Daniel Kandel, Igor Ziselman, Ronen Urenski +1 more | 2022-09-20 |
| 11309162 | TEM-based metrology method and system | Vladimir Machavariani, Michael Shifrin, Daniel Kandel, Igor Ziselman, Ronen Urenski +1 more | 2022-04-19 |