Issued Patents 2022
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11480868 | Determination of optical roughness in EUV structures | Ravi K. Bonam | 2022-10-25 |
| 11309221 | Single metallization scheme for gate, source, and drain contact integration | Andrew M. Greene, Victor Chan | 2022-04-19 |
| 11295969 | Hybridization for characterization and metrology | Matthew Sendelbach, Roy Koret, Aron Cepler, Wei Ti Lee | 2022-04-05 |
| 11276636 | Adjustable via dimension and chamfer angle | Lawrence A. Clevenger, Koichi Motoyama, Cornelius Brown Peethala, Benjamin D. Briggs, Michael Rizzolo | 2022-03-15 |