Issued Patents 2021
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11171236 | Cut-fin isolation regions and method forming same | Li-Wei Yin, Shao-Hua Hsu | 2021-11-09 |
| 11094057 | Semiconductor wafer measurement method and system | Peng Chen, Wen-Hao Cheng, Yung-Jung Chang, Wei-Chung Hu, Yi-An Huang +1 more | 2021-08-17 |
| 11069579 | Semiconductor device and method | Li-Wei Yin, Chen-Huang Huang, Ming-Jhe Sie, Ryan Chia-Jen Chen | 2021-07-20 |
| 11056478 | Metal gate structure cutting process | Ryan Chia-Jen Chen, Shu-Yuan Ku, Ming-Ching Chang | 2021-07-06 |