Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11094057 | Semiconductor wafer measurement method and system | Peng Chen, Shiang-Bau Wang, Wen-Hao Cheng, Yung-Jung Chang, Yi-An Huang +1 more | 2021-08-17 |
WH
Wei-Chung Hu
Overall (2021): #215,724 of 548,734Top 40%
1
Patents 2021