Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11094057 | Semiconductor wafer measurement method and system | Shiang-Bau Wang, Wen-Hao Cheng, Yung-Jung Chang, Wei-Chung Hu, Yi-An Huang +1 more | 2021-08-17 |
PC
Peng Chen
Overall (2021): #305,287 of 548,734Top 60%
1
Patents 2021