Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11094057 | Semiconductor wafer measurement method and system | Peng Chen, Shiang-Bau Wang, Wen-Hao Cheng, Yung-Jung Chang, Wei-Chung Hu +1 more | 2021-08-17 |
| 11088023 | Method of forming a semiconductor structure | Pin-Hong Chen, Chih-Chieh Tsai, Tzu-Chieh Chen, Kai-Jiun Chang, Chia-Chen Wu +3 more | 2021-08-10 |